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Experts
- Thierry Bouwmans
- Patrick Bouthemy
- Guisheng Liao
- Kang-Hyun Jo
- Gian Luca Foresti
- Xiang-Gen Xia
- Seiichiro Katsura
- Larry S. Davis
- Antonio Fernández-Caballero
- Rama Chellappa
- Mubarak Shah
- Guillaume-Alexandre Bilodeau
- Oksam Chae
- Andrea Cavallaro
- Thomas Sikora
- Rin-Ichiro Taniguchi
- Toshio Fukuda
- Atsushi Shimada
- Wen Gao
- Mengdao Xing
- Jigen Peng
- Janusz Konrad
- Shih-Chia Huang
- Saeid Nahavandi
- Carlo S. Regazzoni
- Xin Li
- Jun Zhang
- Gérard G. Medioni
- Soon Ki Jung
- Wei Wang
- Ezequiel López-Rubio
- Xingzhao Liu
- Kouhei Ohnishi
- Rita Cucchiara
- Sajid Javed
- Jianyu Yang
- Hongxin Wang
- Hajime Asama
- Tieniu Tan
Venues
- CoRR
- Sensors
- IEEE Access
- ICRA
- IROS
- ICIP
- ICASSP
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- Multim. Tools Appl.
- Remote. Sens.
- EMBC
- CVPR
- ICPR
- AVSS
- ACC
- IEEE Geosci. Remote. Sens. Lett.
- ROBIO
- SMC
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Image Process.
- ISCAS
- ITSC
- EUSIPCO
- FUSION
- ICCV
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Intell. Transp. Syst.
- CDC
- CVPR Workshops
- ICME
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Signal Process.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- 计算机科学
- Neurocomputing
- IEEE Trans. Ind. Electron.
- Pattern Recognit.
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