Towards Zero Defect Manufacturing paradigm: A review of the state-of-the-art methods and open challenges.
Bianca CaiazzoMario Di NardoTeresa MurinoAlberto PetrilloGianluca PiccirilloStefania SantiniPublished in: Comput. Ind. (2022)
Keyphrases
- lessons learned
- open issues
- real world
- manufacturing systems
- technical challenges
- quality control
- automated visual inspection
- key issues
- neural network
- decision making
- defect detection
- data mining
- social networks
- concurrent engineering
- computing paradigms
- mass customization
- manufacturing process
- current status
- decision trees
- literature review
- knowledge base
- computational intelligence
- multi agent systems