Test Quality and Fault Risk in Digital Filter Datapath BIST.
Laurence GoodbyAlex OrailogluPublished in: DATE (2000)
Keyphrases
- fault diagnosis
- risk management
- high quality
- built in self test
- fault detection
- filtering algorithm
- image processing
- multiple faults
- risk factors
- higher quality
- preprocessing step
- data sets
- noise removal
- feature selection
- low quality
- multimedia
- quality measures
- decision making
- data quality
- test data
- high frequency
- decision support system