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Exploring the use of approximate TMR to mask transient faults in logic with low area overhead.

Iuri A. C. GomesMayler G. A. MartinsAndré Inácio ReisFernanda Lima Kastensmidt
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • fault diagnosis
  • logic programming
  • high levels
  • built in self test
  • multi valued
  • image sequences
  • modal logic
  • fault detection
  • predicate logic
  • epistemic logic
  • multiple faults