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Exploring the use of approximate TMR to mask transient faults in logic with low area overhead.
Iuri A. C. Gomes
Mayler G. A. Martins
André Inácio Reis
Fernanda Lima Kastensmidt
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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fault diagnosis
logic programming
high levels
built in self test
multi valued
image sequences
modal logic
fault detection
predicate logic
epistemic logic
multiple faults