Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey.
Usha Sandeep MehtaKankar S. DasguptaNiranjan M. DevashrayeePublished in: VLSI Design (2010)
Keyphrases
- run length
- test data
- run length encoding
- compression rate
- gray level
- test cases
- training data
- compression ratio
- test set
- upper bound
- data sets
- texture information
- lower bound
- sample size
- training set
- data compression
- data hiding
- image compression
- compression algorithm
- video compression
- lossy compression
- search based testing
- compressed images
- compression scheme
- image quality
- worst case
- sampling rate
- lossless compression
- training and test data
- feature extraction
- image processing