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Chiba Scan Delay Fault Testing with Short Test Application Time.

Kazuteru NambaHideo Ito
Published in: J. Electron. Test. (2010)
Keyphrases
  • test data
  • data mining
  • data structure
  • test cases
  • closed loop
  • software testing
  • regression testing
  • databases
  • evolutionary algorithm
  • testing process
  • test driven development