Low-Frequency Noise Measurements to Characterize Cu-Electromigration Down to 44nm Metal Pitch.
Sofie BeyneOlalla Varela PedreiraIngrid De WolfZsolt TokeiKristof CroesPublished in: IRPS (2019)
Keyphrases
- low frequency
- high frequency
- electromagnetic fields
- frequency domain
- wavelet transform
- subband
- wavelet coefficients
- wavelet analysis
- low and high frequency
- frequency band
- measurement noise
- discrete wavelet transform
- original images
- low pass
- metal oxide
- high frequency components
- multiresolution
- fusion rules
- wavelet domain
- high resolution
- electron microscopy
- contourlet transform
- spatial domain