Detection of Water-Stains Defects in TFT-LCD Based on Machine Vision.
Lingfeng KongJie ShenZongliang HuKe PanPublished in: CISP-BMEI (2018)
Keyphrases
- machine vision
- automated visual inspection
- surface defects
- tft lcd
- image processing
- quality control
- character recognition
- thin film transistor
- surface inspection
- vision system
- computer vision
- liquid crystal displays
- machine learning
- face recognition
- real time
- motion estimation
- signal processing
- multi view
- defect detection