Login / Signup
Comparison of ZnO thin films deposited by three different SILAR processes.
C. Vargas-Hernández
F. N. Jiménez-García
J. F. Jurado
V. Henao Granada
Published in:
Microelectron. J. (2008)
Keyphrases
</>
thin film
electron microscopy
chemical vapor deposition
silicon nitride
film thickness
high density
short circuit
grain size
solar cell
multi layer
room temperature
neural network
white light interferometry
database
plasma etching
electrical properties
genetic algorithm
databases