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On the application of formal fault localization to automated RTL-to-TLM fault correspondence analysis for fast and accurate VP-based error effect simulation - a case study.

Vladimir HerdtHoang M. LeDaniel GroßeRolf Drechsler
Published in: FDL (2016)
Keyphrases
  • fault localization
  • correspondence analysis
  • fault detection
  • model based diagnosis
  • neural network
  • data mining
  • machine learning
  • factor analysis
  • data model
  • database management systems
  • fault diagnosis
  • error detection