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Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells.

Melanie BrocardBenoît MathieuJean-Philippe ColonnaCristiano SantosClaire Fenouillet-BérangerCao-Minh Vincent LuGerald CibrarioLaurent BrunetPerrine BatudeFrançois AndrieuSébastien ThuriesOlivier Billoint
Published in: ISVLSI (2017)
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