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EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester.
Koji Nakamae
Takashi Ishimura
Hiromu Fujioka
Published in:
Systems and Computers in Japan (2000)
Keyphrases
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localization algorithm
test cases
fault diagnosis
fault detection
software testing
fault models
testing process
service quality
asynchronous circuits
logic circuits
computer vision
language model
multi modal
user satisfaction
model based diagnosis
fault management