Design, Verification and Testing of a Readout Integrated Circuit for Hybrid Pixel X-ray Detectors with In-Pixel Time Measurement Functionality in 28 nm CMOS.
Lukasz A. KadlubowskiPublished in: MIXDES (2023)
Keyphrases
- x ray
- integrated circuit
- metal oxide semiconductor
- electron beam
- transmission electron microscopy
- image sensor
- x ray images
- medical imaging
- analog to digital converter
- input image
- low cost
- intraoperative
- ct scans
- design parameters
- digital x ray images
- real time
- tomographic images
- metal oxide
- electron microscopy
- dynamic range
- cmos technology
- projection images
- three dimensional
- pre operative
- solid state
- hardware description language
- computed tomography
- high speed
- edge detection