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Memory Efficient ATPG for Path Delay Faults.
Wangning Long
Shiyuan Yang
Zhongcheng Li
Yinghua Min
Published in:
Asian Test Symposium (1997)
Keyphrases
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memory efficient
fault diagnosis
external memory
fault detection
iterative deepening
path length
multiple sequence alignment
test cases
shortest path
model based diagnosis
optimal path
destination node
multiple faults
multiple paths
abnormal events
multicast tree
error detection
orders of magnitude