Nanosphere Lithography-Based Fabrication of Spherical Nanostructures and Verification of Their Hexagonal Symmetries by Image Analysis.
Mária DomonkosAlexander KromkaPublished in: Symmetry (2022)
Keyphrases
- image analysis
- electron beam
- electron beam lithography
- integrated circuit
- model checking
- pattern recognition
- computer vision
- mathematical morphology
- image processing
- x ray
- visual inspection
- boundary conditions
- scale space
- formal verification
- high density
- image segmentation
- three dimensional
- medical imaging
- multispectral
- high speed
- tensor scale
- semiconductor devices
- image understanding
- face verification
- feature points
- neural network
- texture classification
- multiscale
- spherical harmonics
- remote sensing
- design parameters
- signature verification
- panoramic images