Reliability-Aware Voltage Scaling of Multicore Processors in Dark Silicon Era.
Hamid NejatollahiMostafa E. SalehiPublished in: TopHPC (2017)
Keyphrases
- multicore processors
- computing power
- liquid crystal
- operating system
- silicon dioxide
- field effect transistors
- high speed
- parallel architectures
- electrical properties
- gate dielectrics
- parallel algorithm
- parallel programming
- highly parallel
- computing systems
- high density
- high end
- power system
- charge coupled device
- information systems
- computational power
- low cost
- general purpose