Test generation for resistive opens in CMOS.
Arun KrishnamacharyJacob A. AbrahamPublished in: ACM Great Lakes Symposium on VLSI (2002)
Keyphrases
- test generation
- test cases
- symbolic execution
- high speed
- design automation
- analog vlsi
- power consumption
- test sequences
- low cost
- circuit design
- static analysis
- quality assurance
- mutation testing
- low power
- software testing
- image sensor
- real world
- artificial intelligence
- data flow
- software systems
- image data
- xml documents
- computer vision
- code coverage