PATEGE: an automatic DC parametric test generation system for series gated ECL circuits.

Takuji Ogihara Shuichi Saruyama Shinichi Murai

Published in: DAC (1985)

Keyphrases

test generation
test cases
symbolic execution
static analysis
test sequences
software testing
high speed
mutation testing
design automation
training data
training set
query processing
fully automatic
code coverage