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Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture.
Manish Sharma
Janak H. Patel
Jeff Rearick
Published in:
VTS (2003)
Keyphrases
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test data
test cases
training data
test set
training set
data sets
search based testing
training and test data
test suite
test generation
test data generation
databases
image compression
query language
feature space
database systems
testing process