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Nano-technology aware investigations on fault-masking techniques in the presence of high fault probabilities.
Matthias Sand
Volkmar Sieh
Dietmar Fey
Published in:
HPCS (2010)
Keyphrases
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fault diagnosis
fault detection
fault model
case study
rapid development
multiple faults
cost effective
nano scale
key technologies
software engineering
wide range
website
database
decision trees
error detection
fault management
artificial intelligence
neural network