A New Class of Sequential Circuits with Acyclic Test Generation Complexity.

Chia Yee Ooi Hideo Fujiwara

Published in: ICCD (2006)

Keyphrases

test generation
test cases
database schemes
symbolic execution
test sequences
computational complexity
np hard
quality assurance
relational databases
case study
static analysis
design automation
image data
software testing
decision trees
image processing
artificial intelligence
real world