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Reducibility of Sequential Test Generation to Combinational Test Generation for Several Delay Fault Models.
Tsuyoshi Iwagaki
Satoshi Ohtake
Hideo Fujiwara
Published in:
Asian Test Symposium (2003)
Keyphrases
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test generation
test cases
static analysis
design automation
quality assurance
fault models
software testing
model based diagnosis
database
knowledge base
data model
knowledge representation
source code
inference rules