Automatic Test Generation for Combinational Threshold Logic Networks.
Pallav GuptaRui ZhangNiraj K. JhaPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2008)
Keyphrases
- test generation
- test cases
- asynchronous circuits
- test sequences
- symbolic execution
- social networks
- design automation
- static analysis
- logic programming
- quality assurance
- logic circuits
- modal logic
- software testing
- programming language
- machine learning
- mutation testing
- database
- cooperative
- database systems
- computer vision
- databases