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Test generation and concurrent error detection in current-mode A/D converters.
Chin-Long Wey
Shoba Krishnan
Sondes Sahli
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)
Keyphrases
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error detection
test generation
error correction
error recovery
test cases
design automation
data cleansing
life cycle
static analysis
test sequences
fault isolation
artificial intelligence
error correcting
quality assurance
quality control
pattern matching
relational databases
case study
decision trees