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A low-cost built-in error correction circuit design for STT-MRAM reliability improvement.
Wang Kang
Weisheng Zhao
Zhaohao Wang
Yue Zhang
Jacques-Olivier Klein
Youguang Zhang
Claude Chappert
Dafine Ravelosona
Published in:
Microelectron. Reliab. (2013)
Keyphrases
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error correction
circuit design
low cost
error detection
error correcting
data hiding
design considerations
low power
design automation
error analysis
channel coding
digital circuits
error detection and correction
error control
magnetic tape
data acquisition
real time
ldpc codes
random access memory