Satisfiability-Based Functional Delay Fault Testing.

Joonyoung Kim João P. Marques Silva Karem A. Sakallah

Published in: VLSI (1999)

Keyphrases

fault model
fault diagnosis
satisfiability problem
fault detection
np complete
test set
propositional logic
test cases
test data
genetic algorithm
computational complexity
phase transition
normal operation
real time embedded systems