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Low-Leakage SRAM Wordline Drivers for the 28-nm UTBB FDSOI Technology.
Pasquale Corsonello
Fabio Frustaci
Stefania Perri
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
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cmos technology
data processing
cost effective
power consumption
leakage current
rapid development
case study
computer systems
dynamic random access memory
nm technology
data transmission
low power
metal oxide
technological advances
key technologies
real time
website
artificial intelligence
learning algorithm