Correlation studies for component level ball impact shear test and board level drop test.
Ee-Hua WongRanjan RajooS. K. W. SeahC. S. SelvanayagamW. D. van DrielJ. F. J. M. CaersX. J. ZhaoN. OwensL. C. TanM. LeoniP. L. EuY.-S. LaiC.-L. YehPublished in: Microelectron. Reliab. (2008)