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Parity prediction synthesis for nano-electronic gate designs.
D. A. Tran
Arnaud Virazel
Alberto Bosio
Luigi Dilillo
Patrick Girard
Serge Pravossoudovitch
Hans-Joachim Wunderlich
Published in:
ITC (2010)
Keyphrases
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nano scale
prediction accuracy
prediction algorithm
prediction error
machine learning
prediction model
design automation
design space exploration
neural network
power consumption
error correction
data sets
website
nm technology