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Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost.
Dong Xiang
Krishnendu Chakrabarty
Dianwei Hu
Hideo Fujiwara
Published in:
ATS (2007)
Keyphrases
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test data
test cases
testing process
software testing
training data
complete coverage
test set
test suite
search based testing
test data generation
cd rom
data sets
test generation
training set
training and test data
database systems
software engineering
feature extraction