High-level delay test generation for modular circuits.
Joonhwan YiJohn P. HayesPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
- test generation
- high level
- low level
- test cases
- symbolic execution
- power dissipation
- design automation
- high speed
- static analysis
- software testing
- test sequences
- mutation testing
- quality assurance
- programming language
- source code
- circuit design
- power consumption
- regression testing
- code coverage
- conceptual model
- semantic information
- multi agent