Robustness of sift feature descriptors to imaging parameters in laser scanning microscopy.
Devrim ÜnayStefan G. StanciuPublished in: SIU (2018)
Keyphrases
- feature descriptors
- laser scanning
- high resolution
- microscopy images
- image features
- image analysis
- local binary pattern
- feature points
- image matching
- shape features
- visual inspection
- shape descriptors
- texture classification
- maximum likelihood
- expectation maximization
- distance metric
- training set
- image processing
- three dimensional
- medical imaging
- computer vision
- object recognition
- image patches
- viewpoint
- machine learning
- image classification
- high dimensional