Performance degradation of LC-tank VCOs by impact of digital switching noise in lightly doped substrates.
Charlotte SoensGeert Van der PlasPiet WambacqStéphane DonnayMaarten KuijkPublished in: IEEE J. Solid State Circuits (2005)
Keyphrases
- room temperature
- noise level
- high density
- noise model
- random noise
- noise reduction
- noise sensitivity
- high impact
- missing data
- signal to noise ratio
- image degradation
- circuit design
- control system
- noise free
- low snr
- digital forensics
- thin film
- image noise
- noise removal
- data sets
- digital content
- image structure
- noisy data
- image enhancement
- monitoring system
- multimedia