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Classifying Image Stacks of Specular Silicon Wafer Back Surface Regions: Performance Comparison of CNNs and SVMs.
Corinna Kofler
Robert Muhr
Gunter Spöck
Published in:
Sensors (2019)
Keyphrases
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image stacks
support vector
photometric properties
three dimensional
surface roughness
electron microscopy
dichromatic reflection model
transparent objects
si sio
object surface
cellular neural networks
single image
tubular structures
region of interest
specular surfaces
diffuse reflectance
input image
ground truth