DICHROMATIC REFLECTION MODEL
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Imari Sato
- Luc Van Gool
- Pieter Peers
- Stamatios Georgoulis
- Ko Nishino
- Shihao Wu
- Charles K. Gatebe
- Tinne Tuytelaars
- Mengyang Pu
- Graham Fyffe
- Hossein Ragheb
- Daniel Cohen-Or
- Hui Huang
- Shoji Tominaga
- Norimichi Tsumura
- Yinqiang Zheng
- Jonathan T. Barron
- Tomoyuki Nishita
- Yoichi Sato
- Edwin R. Hancock
- Jitendra Malik
- Jiandong Tian
- Yuji Iwahori
- Giuseppe Claudio Guarnera
- Steven W. Zucker
- Toshiaki Tsuji
- Takayuki Okatani
- Shawn Mathew
- Matan Sela
- Ron Kimmel
- Katsushi Ikeuchi
- Saad Nadeem
- Konstantinos Rematas
- Arie E. Kaufman
- Matthias Zwicker
- Tongbo Chen
- Koichiro Deguchi
Venues
- CoRR
- Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- Sensors
- CVPR
- ACM Trans. Graph.
- Color Imaging Conference
- ICCV
- ICIP
- Comput. Graph. Forum
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Access
- IEEE Trans. Image Process.
- SIGGRAPH Posters
- Int. J. Comput. Vis.
- JURSE
- ICIAP
- IEEE Trans. Instrum. Meas.
- BMVC
- CCIW
- IEEE Geosci. Remote. Sens. Lett.
- ICPR
- Digital Photography
- SIGGRAPH (Conference Paper Track)
- Pattern Recognit.
- ICIP (3)
- Sci. China Inf. Sci.
- HAIS
- ICIP (2)
- CRV
- VISAPP (2)
- IROS
- CAIP
- Smart Graphics
- GEOINFO
- IEEE Trans. Ind. Informatics
- ECCV (2)
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