DICHROMATIC REFLECTION MODEL
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Imari Sato
- Ko Nishino
- Pieter Peers
- Stamatios Georgoulis
- Luc Van Gool
- Charles K. Gatebe
- Michael S. Langer
- Steven W. Zucker
- Qingji Guan
- Tiziano Portenier
- Mengyang Pu
- Tobias Ritschel
- Hui Huang
- Toshiaki Tsuji
- Yaping Huang
- Shihao Wu
- Jiandong Tian
- Graham Fyffe
- Giuseppe Claudio Guarnera
- Norimichi Tsumura
- Daniel Cohen-Or
- Matthias Zwicker
- Katsushi Ikeuchi
- Hossein Ragheb
- Shawn Mathew
- Tinne Tuytelaars
- Koichiro Deguchi
- Konstantinos Rematas
- Haibin Ling
- Ron Kimmel
- Mario Fritz
- Tomoyuki Nishita
- Jonathan T. Barron
- Yoichi Sato
- Yandong Tang
- Jitendra Malik
- Shoji Tominaga
Venues
- CoRR
- Remote. Sens.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- Sensors
- CVPR
- ACM Trans. Graph.
- Color Imaging Conference
- ICCV
- ICIP
- Comput. Graph. Forum
- IEEE Trans. Image Process.
- IEEE Access
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- BMVC
- IEEE Trans. Instrum. Meas.
- JURSE
- SIGGRAPH Posters
- ICIAP
- CCIW
- ICPR
- Int. J. Comput. Vis.
- IEEE Geosci. Remote. Sens. Lett.
- Pattern Recognit.
- VISAPP
- Image Processing: Machine Vision Applications
- IEEE Trans. Ind. Informatics
- CAD/Graphics
- IEEE Visualization
- MICCAI (8)
- WACV
- J. Intell. Manuf.
- SIGGRAPH
- SIGGRAPH Studio
- ICIAR
- Multim. Tools Appl.
- Shape, Contour and Grouping in Computer Vision
- WHISPERS
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