DICHROMATIC REFLECTION MODEL
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Imari Sato
- Pieter Peers
- Stamatios Georgoulis
- Luc Van Gool
- Ko Nishino
- Matthias Zwicker
- Katsushi Ikeuchi
- Hossein Ragheb
- Shawn Mathew
- Tinne Tuytelaars
- Koichiro Deguchi
- Konstantinos Rematas
- Haibin Ling
- Ron Kimmel
- Mario Fritz
- Jonathan T. Barron
- Tomoyuki Nishita
- Yoichi Sato
- Yandong Tang
- Jitendra Malik
- Shoji Tominaga
- Edwin R. Hancock
- Tongbo Chen
- Matan Sela
- Yuji Iwahori
- Saad Nadeem
- Yinqiang Zheng
- Arie E. Kaufman
- Takayuki Okatani
- Charles K. Gatebe
- Steven W. Zucker
- Michael S. Langer
- Qingji Guan
- Tiziano Portenier
- Mengyang Pu
- Hui Huang
- Tobias Ritschel
Venues
- CoRR
- Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- CVPR
- Sensors
- ACM Trans. Graph.
- ICIP
- Comput. Graph. Forum
- ICCV
- Color Imaging Conference
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Access
- IEEE Trans. Image Process.
- IEEE Geosci. Remote. Sens. Lett.
- Int. J. Comput. Vis.
- ICIAP
- CCIW
- ICPR
- SIGGRAPH Posters
- JURSE
- IEEE Trans. Instrum. Meas.
- BMVC
- ECCV (1)
- IEEE Trans. Haptics
- 3DIM
- CAIP
- Pattern Recognit.
- DAGM-Symposium
- J. Circuits Syst. Comput.
- VISAPP (1)
- Digital Photography
- ICCP
- Image Processing: Machine Vision Applications
- IEEE Trans. Ind. Informatics
- Sci. China Inf. Sci.
- Signal Process.
- ECCV (4)
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