Login / Signup

On test data volume reduction for multiple scan chain designs.

Sudhakar M. ReddyKohei MiyaseSeiji KajiharaIrith Pomeranz
Published in: ACM Trans. Design Autom. Electr. Syst. (2003)
Keyphrases
  • test data
  • training data
  • test set
  • test cases
  • data sets
  • testing process
  • computer vision
  • training and test data
  • search algorithm
  • training set
  • active learning
  • principal component analysis