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Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters.
Masaki Tsukude
Kazutami Arimoto
Hideto Hidaka
Yasuhiro Konishi
Masanori Hayashikoshi
Katsuhiro Suma
Kazuyasu Fujishima
Published in:
IEEE Des. Test Comput. (1993)
Keyphrases
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highly reliable
high speed
web services composition
low cost
high voltage
physical design
test cases
analog vlsi
power system
low voltage
digital signal processors
real time
cmos technology
electric field
transmission line
high density
computational intelligence