Interconnect and Delay Testing with a 4800-Pin Board Tester.

Shuichi Kameyama Hideyuki Ohara Chihiro Endo Naoki Takayama

Published in: ITC (1992)

Keyphrases

test cases
software testing
power dissipation
testing process
black box
high speed
neural network
artificial intelligence
information systems
statistical tests
test suite
data sets
data mining
bayesian networks
test generation