Naoki Takayama

Publication Activity (10 Years)

Years Active: 1992-2012
Publications (10 Years): 0

Top Topics

Signal To Noise Ratio

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Top Venues

IEICE Trans. Fundam. Electron. Commun. Comput. Sci.

Publications

Ning Li, Keigo Bunsen, Naoki Takayama, Qinghong Bu, Toshihide Suzuki, Masaru Sato, Yoichi Kawano, Tatsuya Hirose, Kenichi Okada, Akira Matsuzawa
A 24 dB Gain 51-68 GHz Common Source Low Noise Amplifier Using Asymmetric-Layout Transistors. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2) (2012)
Kenichi Okada, Kota Matsushita, Keigo Bunsen, Rui Murakami, Ahmed Musa, Takahiro Sato, Hiroki Asada, Naoki Takayama, Ning Li, Shogo Ito, Win Chaivipas, Ryo Minami, Akira Matsuzawa
A 60GHz 16QAM/8PSK/QPSK/BPSK direct-conversion transceiver for IEEE 802.15.3c. ISSCC (2011)
Kenichi Okada, Ning Li, Kota Matsushita, Keigo Bunsen, Rui Murakami, Ahmed Musa, Takahiro Sato, Hiroki Asada, Naoki Takayama, Shogo Ito, Win Chaivipas, Ryo Minami, Tatsuya Yamaguchi, Yasuaki Takeuchi, Hiroyuki Yamagishi, Makoto Noda, Akira Matsuzawa
A 60-GHz 16QAM/8PSK/QPSK/BPSK Direct-Conversion Transceiver for IEEE802.15.3c. IEEE J. Solid State Circuits 46 (12) (2011)
Ning Li, Qinghong Bu, Kota Matsushita, Naoki Takayama, Shogo Ito, Kenichi Okada, Akira Matsuzawa
Topology and Design Considerations of 60 GHz CMOS LNAs for Noise Performance Improving. IEICE Trans. Electron. (12) (2011)
Naoki Takayama, Kota Matsushita, Shogo Ito, Ning Li, Kenichi Okada, Akira Matsuzawa
A 60GHz direct-conversion transmitter in 65nm CMOS technology. ASP-DAC (2010)
Ning Li, Kota Matsushita, Naoki Takayama, Shogo Ito, Kenichi Okada, Akira Matsuzawa
Evaluation of a Multi-Line De-Embedding Technique up to 110 GHz for Millimeter-Wave CMOS Circuit Design. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2) (2010)
Ning Li, Keigo Bunsen, Naoki Takayama, Qinghong Bu, Toshihide Suzuki, Masaru Sato, Tatsuya Hirose, Kenichi Okada, Akira Matsuzawa
A 24 dB gain 51-68 GHz CMOS low noise amplifier using asymmetric-layout transistors. ESSCIRC (2010)
Naoki Takayama, Kota Matsushita, Shogo Ito, Ning Li, Keigo Bunsen, Kenichi Okada, Akira Matsuzawa
A De-Embedding Method Using Different-Length Transmission Lines for mm-Wave CMOS Device Modeling. IEICE Trans. Electron. (6) (2010)
Shuichi Kameyama, Hideyuki Ohara, Chihiro Endo, Naoki Takayama
Interconnect and Delay Testing with a 4800-Pin Board Tester. ITC (1992)