Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets.
Erik BuryAdrian ChasinBen KaczerMichiel VandemaeleStanislav TyaginovJacopo FrancoRomain RitzenthalerHans MertensPieter WeckxN. HoriguchiDimitri LintenPublished in: IRPS (2022)