Stuck-at-fault testing for quasi-delay-insensitive logic circuits.
Arthit ThongtakTakashi NanyaPublished in: Systems and Computers in Japan (1998)
Keyphrases
- delay insensitive
- logic circuits
- low power
- power consumption
- low cost
- high speed
- functional decomposition
- asynchronous circuits
- fault diagnosis
- fault model
- gate array
- tunnel diode
- fault detection
- test cases
- neural network
- pattern recognition
- real time embedded systems
- logic synthesis
- digital signal processing
- power dissipation
- image processing