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Delay fault testing of iterative arithmetic arrays.

Rabindra K. RoyNaveena NagiAbhijit ChatterjeeManuel A. d'Abreu
Published in: VTS (1992)
Keyphrases
  • fault diagnosis
  • fault detection
  • fault model
  • test set
  • power consumption
  • failure modes
  • learning algorithm
  • data structure
  • expert systems
  • training set
  • multiresolution