Automated defect inspection of light-emitting diode chips using neural network and statistical approaches.
Hong-Dar LinPublished in: Expert Syst. Appl. (2009)
Keyphrases
- light emitting
- statistical approaches
- neural network
- light emitting diodes
- defect detection
- automated visual inspection
- statistical methods
- light intensity
- high speed
- back propagation
- neural network model
- artificial neural networks
- integrated circuit
- quality control
- image analysis
- surface inspection
- bp neural network
- machine vision
- statistical analysis
- machine learning