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Large-Scale 3D Chips: Challenges and Solutions for Design Automation, Testing, and Trustworthy Integration.
Johann Knechtel
Ozgur Sinanoglu
Ibrahim Abe M. Elfadel
Jens Lienig
Cliff C. N. Sze
Published in:
IPSJ Trans. Syst. LSI Des. Methodol. (2017)
Keyphrases
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design automation
test generation
real world
computer aided design
small scale
optimal solution
high speed
test cases
lessons learned
circuit design
computer vision
training set
computer assisted
integrated circuit
practical solutions