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The Complexity of Generating Minimum Test Sets for PLA's and Monotone Combinational Circuits.
Sreejit Chakravarty
Harry B. Hunt III
S. S. Ravi
Daniel J. Rosenkrantz
Published in:
IEEE Trans. Computers (1989)
Keyphrases
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test set
error rate
test data
training set
logic circuits
training data
data sets
asynchronous circuits
evaluation methodology
worst case
test cases
computational cost
machine learning
prior knowledge
uniform distribution
computational complexity
random selection
database
training and test sets