Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation.

Masayuki Arai Shingo Inuyama Kazuhiko Iwasaki

Published in: ITC (2017)

Keyphrases

test generation
test cases
symbolic execution
pattern matching
test sequences
post processing
design automation
quality assurance
static analysis
mutation testing
software testing
image quality
data management
data warehouse
multi agent
test data generation
training data
image processing
information systems