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A New ATPG Technique (ExpoTan) for Testing Analog Circuits.
B. K. S. V. L. Varaprasad
Lalit M. Patnaik
Hirisave S. Jamadagni
V. K. Agrawal
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
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analog circuits
digital circuits
fault diagnosis
wavelet packet transform
neural network
test cases
data sets
data mining
image processing
wavelet transform
machine learning
decision making
hidden markov models
test set
test data
software testing