Test Pattern Generation and Compaction for Crosstalk Induced Glitches and Delay Faults.

Shehzad Hasan Ajoy Kumar Palit Walter Anheier

Published in: VLSI Design (2010)

Keyphrases

fault diagnosis
fault detection
abnormal events
root cause
neural network
evolutionary algorithm
multiresolution
software engineering
test cases
correlation analysis
critical path
fault detection and diagnosis
processor sharing
multiple faults