An analysis of scale-space sampling in SIFT.
Ives Rey-OteroJean-Michel MorelMauricio DelbracioPublished in: ICIP (2014)
Keyphrases
- scale space
- multiscale
- scale invariant
- keypoints
- scale spaces
- multiple scales
- image analysis
- image features
- scale selection
- image structure
- rotationally invariant
- vector valued
- feature detection
- object recognition
- critical points
- scale parameter
- deep structure
- neural network
- methods in computer vision
- image enhancement
- feature points
- similarity measure
- feature selection