SCALE PARAMETER
Experts
- Luc Florack
- Bart M. ter Haar Romeny
- Max A. Viergever
- Atsushi Imiya
- Tony Lindeberg
- Tomoya Sakai
- Ardelio Galletti
- Joachim Weickert
- Alfons H. Salden
- Jean-Michel Morel
- Arjan Kuijper
- J. Andrew Bangham
- Yulong Huang
- Songde Ma
- Jan J. Koenderink
- Livia Marcellino
- Andrew P. Witkin
- Nir A. Sochen
- Yonggang Zhang
- Makoto Sato
- Raffaele Farina
- Jon Sporring
- Jasjit S. Suri
- Ángel F. García-Fernández
- Frans Kanters
- Paul T. Jackway
- Chen Sagiv
- Ali Shokoufandeh
- Keiichi Uchimura
- Yuchen He
- Gou Koutaki
- Salvatore Cuomo
- Sung Ha Kang
- Michael Felsberg
- Yong Liu
- Tianjia Shao
- Ryo Okutani
- Allan D. Jepson
- Dipti Prasad Mukherjee
Venues
- CoRR
- Scale-Space
- IEEE Trans. Pattern Anal. Mach. Intell.
- SSVM
- J. Math. Imaging Vis.
- ICIP
- ICASSP
- IEEE Trans. Image Process.
- ICPR
- Pattern Recognit.
- Int. J. Comput. Vis.
- Commun. Stat. Simul. Comput.
- CVPR
- Symmetry
- ICPR (3)
- IEEE Trans. Signal Process.
- Signal Process.
- IEEE Access
- Qual. Reliab. Eng. Int.
- ISBI
- SSPR/SPR
- Comput. Stat. Data Anal.
- ICIP (1)
- Inf. Sci.
- IGARSS
- Model. Assist. Stat. Appl.
- Remote. Sens.
- Discret. Math.
- ECCV (1)
- Appl. Math. Comput.
- ISCAS
- IEEE Trans. Inf. Theory
- DSSCV
- Pattern Recognit. Lett.
- FUSION
- IEEE Trans. Instrum. Meas.
- BMVC
- CDC
- IEEE Trans. Vis. Comput. Graph.
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